The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Oct. 16, 2018
Massachusetts Institute of Technology, Cambridge, MA (US);
Zhihong Luo, Cambridge, MA (US);
Qiping Zhang, Hong Kong, HK;
Nicholas Selby, Cambridge, MA (US);
Yunfei Ma, Santa Clara, CA (US);
Manish Singh, Delhi, IN;
Fadel Adib, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
A wideband, radio-frequency localization system may estimate the one-dimensional, two-dimensional or three-dimensional position and trajectory of a static or moving object. These estimates may have a high spatial accuracy and low latency. The localization may be determined based on phase or amplitude of a wideband signal in each frequency band in a set of multiple frequency bands. The localization may be based on a single shot of measurements across a wide band of radio frequencies, without frequency hopping. The measurements of the wideband signal may be taken over time and over space at multiple receivers. The localization may be based on measurements taken while a backscatter node remains in a first reflective state or in a second reflective state, rather than when the backscatter node is transitioning between reflective states. In some cases, the localization achieves sub-centimeter spatial resolution in each of three spatial dimensions.