The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Oct. 05, 2018
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Jian Yin, Wuhan, CN;

Wei Wang, Wuhan, CN;

Peng Li, Shenzhen, CN;

Fuxue Liu, Wuhan, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 14/08 (2006.01); H04Q 11/00 (2006.01); H04J 3/14 (2006.01); H04J 3/16 (2006.01); H04L 1/00 (2006.01); H04B 10/079 (2013.01);
U.S. Cl.
CPC ...
H04Q 11/0066 (2013.01); H04B 10/0795 (2013.01); H04J 3/14 (2013.01); H04J 3/1652 (2013.01); H04J 14/08 (2013.01); H04L 1/0078 (2013.01); H04J 2203/006 (2013.01); H04J 2203/0062 (2013.01); H04Q 2011/0081 (2013.01); H04Q 2011/0083 (2013.01);
Abstract

A fault detection method and device is disclosed. The method includes obtaining, by an optical transport network (OTN) device, a first OTN frame. The first OTN frame includes a plurality of payload areas. Each payload area includes payload check information and payload data. The method further includes performing fault detection, according to the payload check information, of payload data of a payload area in which the payload check information is located. The first OTN frame is divided into a plurality of payload areas, and corresponding payload check information is carried in each payload area.


Find Patent Forward Citations

Yin, Jian. (2020). Fault detection method and device (U.S. Patent No. 10575074). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10575074

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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