The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Sep. 13, 2017
Applicant:
Olympus Corporation, Tokyo, JP;
Inventor:
Takanori Ushijima, Tama, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/246 (2018.01); G02B 23/24 (2006.01); A61B 1/00 (2006.01); B23K 26/352 (2014.01); B23K 26/00 (2014.01); B23K 26/361 (2014.01); H04N 13/296 (2018.01); A61B 1/005 (2006.01); A61B 1/05 (2006.01); H04N 5/225 (2006.01); A61B 17/00 (2006.01); B23K 101/20 (2006.01);
U.S. Cl.
CPC ...
H04N 13/246 (2018.05); A61B 1/005 (2013.01); A61B 1/00009 (2013.01); A61B 1/00039 (2013.01); A61B 1/00045 (2013.01); A61B 1/00057 (2013.01); A61B 1/00112 (2013.01); A61B 1/05 (2013.01); B23K 26/0006 (2013.01); B23K 26/355 (2018.08); B23K 26/361 (2015.10); G02B 23/24 (2013.01); H04N 5/2256 (2013.01); H04N 13/296 (2018.05); A61B 2017/00725 (2013.01); B23K 2101/20 (2018.08); H04N 2005/2255 (2013.01);
Abstract
An image calibration inspection tool includes: a plurality of substantially rectangular markers, two orthogonal sides of which are connected by an arc-shaped curve; and a calibration chart in which the plurality of markers are formed on a metal plate through machining, laser marking, or the like, wherein two of the markers in a diagonal direction are separated by a predetermined distance.