The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Mar. 15, 2013
Herman Dean Brewster, Jr., Cicero, NY (US);
Charles William English, Ii, Baldwinsville, NY (US);
Mark Randall Wynkoop, Vernon, NY (US);
Shaun Michael Burdick, Fulton, NY (US);
Noel Dempsey, Brewerton, NY (US);
Herman Dean Brewster, Jr., Cicero, NY (US);
Charles William English, II, Baldwinsville, NY (US);
Mark Randall Wynkoop, Vernon, NY (US);
Shaun Michael Burdick, Fulton, NY (US);
Noel Dempsey, Brewerton, NY (US);
TIME WARNER CABLE ENTERPRISES LLC, St. Louis, MO (US);
Abstract
Methods and apparatus for monitoring a network and generating overall health scores for communications nodes in the network are described. A monitoring system receives information from a variety of system elements and/or devices which provide information relating to communications service. The information received by the network monitoring system includes information indicating the number of outstanding work orders issued in regard to a trouble report, signal power level variance information, signal alarm information, uncorrectable error information, correctable error information, offline device information, etc. A set of scores for a node are generated based on the different types of received information. The scores are combined using a weighted sum to generate an overall node health score. Nodes are ranked based on overall node health scores and maintenance personal can view the scores as well as the underlying information corresponding to a node to facilitate identification of possible faults.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile