The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Jul. 31, 2013
Splunk, Inc., San Francisco, CA (US);
John Coates, Berkeley, CA (US);
Lucas Murphey, Wadsworth, IL (US);
James Hansen, San Ramon, CA (US);
David Hazekamp, Tinley Park, IL (US);
SPLUNK INC., San Francisco, CA (US);
Abstract
A system and computer-implemented is provided for displaying a configurable metric relating to an environment in a graphical display along with a value of the metric calculated over a configurable time period. The metric is used to identify events of interest in the environment based on processing real time machine data from one or more sources. The configurable metric is selected and a corresponding value is calculated based on the events of interest over the configurable time period. The value of the metric may be continuously updated in real time based on receiving additional real-time machine data and displayed in a graphical interface as time progresses. Statistical trends in the value of the metric may also be determined over the configurable time period and displayed in the graphical interface as well as an indication if the value of the metric exceeds a configurable threshold value. Further, a selection of one or more thresholds for the value of the metric may be applied and an indication displayed indicating if the threshold(s) have been exceeded.