The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Feb. 25, 2019
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Venkateswar Reddy Kowkutla, Allen, TX (US);
Erkan Bilhan, Dallas, TX (US);
Venkateswara Reddy Pothireddy, Plano, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/0175 (2006.01); H03K 3/037 (2006.01);
U.S. Cl.
CPC ...
H03K 19/017509 (2013.01); H03K 3/037 (2013.01);
Abstract
A method and circuitry that enables an input/output pin (I/O) on a System on a Chip to function either as an analog or as a digital input/output without compromising the overall performance of the system, thus giving the automated test equipment full flexibility to maximize parallel testing for both analog and digital modules.