The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Apr. 07, 2017
Photo Diagnostic Systems, Inc., Boxboro, MA (US);
Matthew Len Keeler, Bolton, MA (US);
Photo Diagnostic Systems, Inc., Boxboro, MA (US);
Abstract
A method for artifact correction in computed tomography, the method including: (1) acquiring a plurality of data sets associated with at least one low X-ray energy, and at least one high X-ray energy; (2) generating a plurality of preliminary images from the plurality of data sets; (3) identifying sources of an artifact source image; (4) forward projecting the artifact source image to produce artifact source data; (5) selecting and combining the plurality of data sets acquired in order to produce a new subset of data associated with the artifact, whereby to produce artifact reduced data; (6) generating a repaired data set to keep data sets associated with the low X-ray energy in artifact-free data and to introduce data sets associated with the high X-ray energy in regions impacted by an artifact; and (7) generating a final reduced artifact image from the repaired data set.