The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Jan. 03, 2018
Olympus Corporation, Tokyo, JP;
Munenori Fukunishi, Tokyo, JP;
Hideaki Takahashi, Tokyo, JP;
Junichi Mori, Tokyo, JP;
Naoyuki Miyashita, Tokorozawa, JP;
Kiyotomi Ogawa, Tokyo, JP;
Yohei Sakamoto, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
In a measuring device, a second objective optical system is arranged to have a parallax with respect to a first objective optical system. An imaging unit captures a first subject image formed through the first objective optical system at a first imaging timing and captures a second subject image formed through the second objective optical system at a second imaging timing different from the first imaging timing. A virtual image generating unit generates a virtual image based on the first subject image acquired in a case in which the imaging unit is assumed to capture the first subject image at the second imaging timing. A measurement processing unit measures a shape of a subject on the basis of a second image based on the second subject image and the virtual image.