The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Jul. 29, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Tamir Klinger, Brooklyn, NY (US);

Chandrasekhara K. Reddy, Kinnelon, NJ (US);

Ashish Sabharwal, White Plains, NY (US);

Horst C. Samulowitz, White Plains, NY (US);

Gerald J. Tesauro, Croton-on-Hudson, NY (US);

Deepak S. Turaga, Elmsford, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/04 (2013.01);
Abstract

A system, method, and computer program product for automatically selecting from a plurality of analytic algorithms a best performing analytic algorithm to apply to a dataset is provided. The automatically selecting from the plurality of analytic algorithms the best performing analytic algorithm to apply to the dataset enables a training a plurality of analytic algorithms on a plurality of subsets of the dataset. Then, a corresponding prediction accuracy trend is estimated across the subsets for each of the plurality of analytic algorithms to produce a plurality of accuracy trends. Next, the best performing analytic algorithm is selected and outputted from the plurality of analytic algorithms based on the corresponding prediction accuracy trend with a highest value from the plurality of accuracy trends.


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