The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Mar. 27, 2018
Olympus Corporation, Tokyo, JP;
Momoko Yamanashi, Tachikawa, JP;
Tetsuhiro Yamada, Hino, JP;
Toshio Nakamura, Hachioji, JP;
Ryuichi Toyama, Hachioji, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An image analysis apparatus includes a region extraction unit configured to determine, as analysis target regions, respective predetermined regions in a first image and a second image that are acquired at timings before and after execution of a predetermined action to a subject and inputted through an image input unit in a state where an endoscope is continuously inserted in the subject, a distribution characteristic value calculation unit configured to obtain a first distribution characteristic value by extracting a color component of the analysis target region in the first image, and to obtain a second distribution characteristic value by extracting a color component of the analysis target region in the second image, and an image analysis unit configured to calculate the degree of change in the second distribution characteristic value with respect to the first distribution characteristic value.