The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Sep. 26, 2017
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Mehdi Bahrami, Santa Clara, CA (US);
Junhee Park, San Jose, CA (US);
Wei-Peng Chen, Fremont, CA (US);
FUJITSU LIMITED, Kawasaki, JP;
Abstract
A method of test-assisted application programming interface (API) learning includes generating a machine-readable API specification (API spec). The API spec is based on application of machine learning and regular expression processes to an API documentation. The method includes comparing the API spec to other API specifications. Based on the comparison, the method includes identifying a set of similar API specifications. The method includes generating API test inputs based on the set of similar API specifications and the API spec. The method includes calling a native API system using a first API test input of the API test inputs. The method includes receiving a response indicative of whether the first API test input successfully interacts with the native API system. Based on the response, the method includes generating a feedback indicative of an alteration to the API test inputs or to the machine learning or the regular expression processes.