The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Aug. 20, 2015
Applicant:

Nippon Telegraph and Telephone Corporation, Chiyoda-ku, JP;

Inventors:

Tatsuaki Kimura, Musashino, JP;

Akio Watanabe, Musashino, JP;

Tsuyoshi Toyono, Musashino, JP;

Ken Nishimatsu, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/54 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01); G06F 17/40 (2006.01);
U.S. Cl.
CPC ...
G06F 9/542 (2013.01); G06F 11/3024 (2013.01); G06F 11/34 (2013.01); G06F 11/3409 (2013.01); G06F 17/40 (2013.01);
Abstract

Techniques for extracting a set of highly correlated logs without user's prior knowledge of generation rules of logs generated by a machine. A log analysis apparatus includes: a template storage unit configured to store templates for log messages; a template determination unit configured to determine templates corresponding to log messages provided from a to-be-monitored host from the stored templates; an event candidate extraction unit configured to detect templates determined for log messages provided from the same host from the determined templates and extract a sequence of the detected templates as an event candidate; and an event extraction unit configured to extract a sequence of frequently occurring templates as an event from the extracted event candidate.


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