The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Sep. 07, 2017
Verisilicon Microelectronics (Shanghai) Co., Ltd., Shanghai, CN;
Verisilicon Holdings Co., Ltd., Plano, TX (US);
Seshagiri Prasad Kalluri, Richardson, TX (US);
Vijayanand Angarai, Allen, TX (US);
Adam Christopher Krolnik, Wylie, TX (US);
Venkata Krishna Vemireddy, San Jose, CA (US);
VeriSilicon Microelectronics (Shanghai) Co., Ltd., Shanghai, CN;
VeriSilicon Holdings Co., Ltd., Plano, TX (US);
Abstract
A data collection system includes one or more input sensing devices and a data collection device. The data collection device includes data collection circuitry that is continuously activated to capture measurement data samples from the one or more input sensing devices and locally store the measurement data samples. The data collection device also includes a digital processor that is coupled to the data collection circuitry and is activated to locally perform a sample analysis of the measurement data samples, wherein the sample analysis is a regular analysis of routine measurement data samples when the measurement data samples are without a triggering event, and wherein the sample analysis is an event analysis when the measurement data samples include a triggering event. A data collection integrated circuit and a measurement data sample collection method are also included.