The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Jan. 18, 2018
Hewlett-packard Development Company, L.p., Spring, TX (US);
Sang Jin Park, Suwon-si, KR;
Sung Min Park, Suwon-si, KR;
Hyo Joong Kim, Suwon-si, KR;
Jong Woo Lee, Suwon-si, KR;
Mi Young Kim, Suwon-si, KR;
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Abstract
An image forming apparatus capable of detecting a development nip disengaging error and a method of detecting a development nip disengaging error are provided. According to an example method, a test pattern is formed on a photoconductor of an image forming apparatus, the test pattern transferred to an intermediate transfer belt is detected through a sensor from a time when an operation of an adjusting member moving a developing roller is controlled such that the developing roller moves from a disengaging position where the developing roller is spaced from the photoconductor to disengage a development nip from the photoconductor to a developing position where the developing roller is in contact with the photoconductor to form the development nip, and whether the development nip disengaging error occurred is determined based on the detected test pattern.