The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Mar. 08, 2016
International Business Machines Corporation, Armonk, NY (US);
Mitesh A. Agrawal, Karnataka, IN;
Preetham M. Lobo, Bangalore, IN;
Franco Motika, Hopewell Junction, NY (US);
John D. Parker, Fishkill, NY (US);
Gerard M. Salem, Essex Junction, VT (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Embodiments include methods, and computer system, and computer program products for performing system functional test on a chip having partial-good portions. Aspects include: initializing, by system functional test software, a service engine of the chip, performing, by service engine, system functional test, and completing system functional test of chip. The chip may include service engine, a service engine memory and one or more 'partial-good' portions. The initializing may include: loading system functional test software into the service engine memory, identifying each 'partial-good' portion of the chip, writing a “partial-good” parameter for each “partial-good” portion of the chip identified to service engine memory, and triggering execution of system functional test. Method may include: decoding system functional test software, retrieving “partial-good” parameters, initializing “partial-good” portions of chip, and performing system functional test on “partial-good” portions of chip. The chip may include is a processor chip that has one or more “partial-good” cores.