The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Apr. 27, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Wen Chen Cheng, Beijing, CN;

Xin Jie Lv, Beijing, CN;

Xiao Guang Rui, Beijing, CN;

Ling Yun Wang, Beijing, CN;

Wen Jun Yin, Beijing, CN;

Yu Ed Zhao, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 15/06 (2006.01); G01N 5/02 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/007 (2013.01); G01N 5/02 (2013.01); G01N 15/06 (2013.01); G01N 15/0606 (2013.01); G01N 15/0618 (2013.01); G01N 2015/0046 (2013.01); G01N 2015/0693 (2013.01);
Abstract

A system, a computer readable storage medium, and a method for data quality control using a correlated sensor group includes selecting a sensor group, by at least one processor, according to a uniformity and a correlation with air pollution concentration data from a reference station, selecting a time series based on the correlation, generating a particle concentration model between the sensor group and the reference station, calculating a deviation in the particle concentration data from the particle concentration model, and recognizing outliers from the deviation as unacceptable data.


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