The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
May. 17, 2017
Applicant:
Bobst Mex SA, Mex, CH;
Inventors:
Matthieu Richard, Remoray, FR;
Francis Pilloud, Clarens, CH;
Assignee:
BOBST MEX SA, , CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/89 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8914 (2013.01); G01N 21/8901 (2013.01); G01N 2021/8905 (2013.01); G01N 2021/8908 (2013.01); G01N 2021/8917 (2013.01); G01N 2201/0626 (2013.01); G01N 2201/0634 (2013.01); G01N 2201/0636 (2013.01); G01N 2201/0637 (2013.01);
Abstract
A quality control station () for a sheet element processing machine, having at least one camera () arranged for capturing images of sheet elements () transported through the quality control station (), and further having an illumination unit () with at least one light emitter () and two reflectors (), the illumination unit () directing light onto a viewing area of the camera () such that the illumination intensity is constant despite changing media thickness. An illumination unit for such quality control station is disclosed.