The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Jun. 22, 2018
Fujifilm Corporation, Tokyo, JP;
Yasuhiko Kaneko, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
To test object image data IMG, images (possible-defect images Dto D) representing possible defects detected by an image processing unitare added. Adjacent to sliders Land L, a histogram Hindicating the number of detected possible defects for each wall thickness and a histogram Hindicating the number of detected possible defects for each size are displayed, respectively. When a checkbox CBcorresponding to a type of defect is selected by an operation unit, only images of possible defects of the selected type are displayed on the test object image IMG. When the sliders Land Lare operated by the operation unit, only images of possible defects within a wall thickness range selected by the slider Land within a size range selected by the slider Lare displayed, and images of possible defects outside the ranges are erased.