The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Jun. 19, 2019
Applicant:

Tsinghua University, Beijing, CN;

Inventors:

Xiao-Ping Zheng, Beijing, CN;

Xiao-Jiao Deng, Beijing, CN;

Hua Geng, Beijing, CN;

Assignee:

TSINGHUA UNIVERSITY, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3581 (2014.01); G01J 3/42 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3581 (2013.01); G01J 3/42 (2013.01);
Abstract

The present disclosure relates to a terahertz-based high-risk chemical detecting device, which includes a terahertz wave generating unit, a terahertz wave transmitting and receiving unit and an echo analysis unit. The terahertz wave generating unit is configured for generating a terahertz detection signal, a terahertz reference signal and a terahertz local oscillation signal. The terahertz wave transceiver unit is configured to transmit the terahertz detection signal and the terahertz reference signal to a high-risk chemical to be tested, and receive information about carrying a high-risk chemical to be tested. The terahertz echo signal is configured to analyze the terahertz echo signal and the terahertz local oscillation signal to obtain information about a high-risk chemical to be tested. The present disclosure also relates to a terahertz-based high-risk chemical detecting method.


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