The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Nov. 21, 2017
Applicant:

Endress+hauser Conducta Gmbh+co. KG, Gerlingen, DE;

Inventors:

Frank Müller, Stuttgart, DE;

Peter Lindmüller, Essingen, DE;

Daniel Iten, Wernabwil, CH;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
G01N 21/278 (2013.01); G01N 21/274 (2013.01); G01N 21/59 (2013.01); G01N 2201/127 (2013.01);
Abstract

The present application relates to a method for adjusting a measuring device for measuring a measurand of a medium using at least one measuring sensor, including: laboratory calibration of the measuring device in a calibration solution, laboratory calibration of the measuring device in air, determination of a correction factor for correcting the laboratory calibration value of the measuring device in air to the laboratory calibration value of the measuring device in the calibration solution, on-site calibration of the measuring device in air, using the correction factor to correct the on-site calibration value of the measuring device in air, and on-site adjustment of the measuring device using the corrected on-site calibration value.


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