The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Apr. 17, 2018
Applicant:

Board of Trustees of Michigan State University, East Lansing, MI (US);

Inventors:

Nizar Lajnef, Lansing, MI (US);

Mohamed Rhimi, Elmouroujz, TR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01); G01L 1/16 (2006.01); G01M 15/14 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0041 (2013.01); G01L 1/16 (2013.01); G01M 5/0008 (2013.01); G01M 5/0016 (2013.01); G01M 5/0033 (2013.01); G01M 15/14 (2013.01);
Abstract

A computer-implemented method is provided for estimating the remaining life of a structure being monitored by a sensor. The method includes: receiving data from a sensor, where the data is indicative of strain experienced by a structure and is reported as a plurality of cumulative distribution functions; extracting a probability density function from the data received from the sensor; computing a damage index for the structure from parameters of the probability density function, where the damage index is indicative of damage to the structure accumulated over time; and estimating a remaining life of the structure using the damage index.


Find Patent Forward Citations

Lajnef, Nizar. (2020). Methods for estimating remaining life of a monitored structure (U.S. Patent No. 10571360). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10571360

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