The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Dec. 15, 2017
Horiba Instruments Incorporated, Irvine, CA (US);
Harry Jerome Oana, Perth Amboy, NJ (US);
Xiaomei Tong, Edison, NJ (US);
Ronald Joseph Kovach, Edison, NJ (US);
HORIBA INSTRUMENTS INCORPORATED, Irvine, CA (US);
Abstract
An optical system includes a spectrograph having a concave diffraction grating and a detector. An aperture is selectively positioned by an associated actuator or positioning mechanism either into, or out of, an optical path of the input light beam downstream of a sample and prior to entering the spectrograph. A slit plate having a plurality of different size entrance slits is positioned downstream of the aperture and movable by an associated actuator or positioning mechanism to position one of the plurality of entrance slits in the optical path of the input light beam. A controller coupled to the detector and the actuators is configured to control the actuators to selectively position the aperture and the slit plate to provide a selectable resolution of the spectrograph. The aperture setting and slit plate setting may be determined from a lookup table in response to a request for finer or coarser spectral resolution.