The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Aug. 31, 2015
Applicant:

Sharp Kabushiki Kaisha, Sakai, Osaka, JP;

Inventors:

Yoshihisa Adachi, Sakai, JP;

Tetsuya Okumura, Sakai, JP;

Tetsuya Hayashi, Sakai, JP;

Shigemi Maeda, Sakai, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 21/02 (2006.01); G01D 1/00 (2006.01); G01K 7/42 (2006.01); G01D 1/18 (2006.01); G01D 9/02 (2006.01); G01D 3/028 (2006.01); G01D 3/032 (2006.01);
U.S. Cl.
CPC ...
G01D 21/02 (2013.01); G01D 1/00 (2013.01); G01D 1/18 (2013.01); G01D 9/02 (2013.01); G01K 7/42 (2013.01); G01D 3/028 (2013.01); G01D 3/032 (2013.01);
Abstract

Signal processing apparatus includes: an input interface configured to receive an output signal Vfrom a sensor; a prediction circuit configured to generate, on the basis of a relationship different depending on each of a plurality of converged values V, a plurality of predicted values Vcorresponding to a value of the output signal that would be obtained at a time Tafter a time T, in a transition response period before a response time period Tr elapses where Tr denotes a response time period required for a value of the output signal Vto become a converged value Vcorresponding to a value P of a parameter representing a certain property of an object to be measured, in accordance with a value Vof the output signal obtained at the time T; and an estimation circuit configured to generate, on the basis of the value Vof the output signal obtained at the time Tand the plurality of predicted values V, an estimated value Pe of a parameter representing the certain property of the object to be measured.


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