The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Mar. 22, 2017
Applicant:

Hexagon Technology Center Gmbh, Heerbrugg, CH;

Inventors:

Bo Pettersson, Luxembourg, LU;

Håkan Andersson, Karlskoga, SE;

Jonas Wedin, Karlskoga, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/20 (2006.01); G01S 11/12 (2006.01); B25H 1/00 (2006.01); G01C 15/00 (2006.01); G01S 5/00 (2006.01); G01C 3/00 (2006.01); G01S 17/06 (2006.01); G01S 5/02 (2010.01); G01S 19/48 (2010.01); G01C 25/00 (2006.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
G01C 21/20 (2013.01); B25H 1/0092 (2013.01); G01C 3/00 (2013.01); G01C 15/00 (2013.01); G01C 21/206 (2013.01); G01C 25/00 (2013.01); G01S 5/00 (2013.01); G01S 5/02 (2013.01); G01S 5/0263 (2013.01); G01S 11/12 (2013.01); G01S 17/06 (2013.01); G01S 19/48 (2013.01); H04L 65/1069 (2013.01);
Abstract

A method of automated spatial worksite referencing of a networked electronic measuring device with awareness of a rough location information of itself at a worksite location. The method includes querying a database for construction plan information about the rough location and its vicinity and about an actual work progress, computing an actual-state nominal spatial information at the rough location and its vicinity, automatically determining of a fine location of the networked electronic measuring device at the worksite location, by at least one iteration of: automatically determining a measurement point in the vicinity and measuring the measurement point using measurement functionality of the device, and then automatically assimilating the measurement point to the actual-state nominal spatial information and thereby determining the fine location information. When a desired level of accuracy of the determined fine location is not reached, performed another iteration with another additional measurement point is performed.


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