The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Aug. 26, 2016
Wuhan Wuda Zoyon Science and Technology Co., Ltd, Wuhan, CN;
Qingquan Li, Wuhan, CN;
Dejin Zhang, Wuhan, CN;
Min Cao, Wuhan, CN;
Xinlin Wang, Wuhan, CN;
Hong Lin, Wuhan, CN;
WUHAN WUDA ZOYON SCIENCE AND TECHNOLOGY CO., LTD, Wuhan, CN;
Abstract
A three-dimensional measurement sensor based on line structured light, comprising a sensing head and a controller. The sensing head is used for collecting section data and attitude information of its own, and matching the section data with the self attitude information. The sensing head comprises a three-dimensional camera, an attitude sensor, a laser and a control sub-board, wherein the three-dimensional camera is installed at a certain angle relative to the laser, and acquires elevation and grey information about an object surface corresponding to laser rays using a triangulation principle. The attitude sensor, the three-dimensional camera and the laser are installed on the same rigid plane, and the attitude sensor reflects measurement attitude of the three-dimensional camera and the laser in real time. The controller is used for measuring and controlling the sensing head, performing data processing transmission and supporting external control. The sensor realizes synchronous measurement of a measured object with the same attitude and at the same time, and supports high speed and high precision measurement under a high dynamic environment, with the measurement precision reaching a micro grade and the frequency being above 10 KHz.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile