The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10571246 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 25, 2020

Filed:

Feb. 28, 2018
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Jun Yamaguchi, Kanagawa, JP;

Yusuke Moriuchi, Kanagawa, JP;

Nao Mishima, Tokyo, JP;

Takayuki Sasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G06T 5/20 (2006.01); G06T 7/571 (2017.01); G06T 5/00 (2006.01); G01B 11/02 (2006.01); G06T 7/55 (2017.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G01B 11/026 (2013.01); G06T 5/003 (2013.01); G06T 5/20 (2013.01); G06T 7/55 (2017.01); G06T 7/571 (2017.01); H04N 5/2254 (2013.01);
Abstract

According to one embodiment, an image processing apparatus includes a memory and one or more processors. The one or more processors are electrically connected to the memory, and calculate blur correction information to make a blur of a first shape of an object approach a blur of a second shape of the object. The first shape of the object is contained in a first component image of one image. The second shape of the object is contained in a second component image of the one image. The one or more processors calculate a distance between an imaging device and the object based on an image distance when the one image is captured and the blur correction information. The image distance is a distance from a lens up to an image forming surface of the object.


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Yamaguchi, Jun. (2020). Imaging processing apparatus, distance measuring apparatus and processing system (U.S. Patent No. 10571246). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10571246

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