The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Feb. 10, 2017
Applicants:

Carl Zeiss Meditec, Inc., Dublin, CA (US);

Carl Zeiss Meditec Ag, Jena, DE;

Inventors:

Matthew J. Everett, Livermore, CA (US);

Tilman Schmoll, Dublin, CA (US);

Nathan Shemonski, San Francisco, CA (US);

Alexandre R. Tumlinson, San Leandro, CA (US);

Assignees:

CARL ZEISS MEDITEC, INC., Dublin, CA (US);

CARL ZEISS MEDITEC AG, Jena, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01); A61B 3/15 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); A61B 3/102 (2013.01); A61B 3/1225 (2013.01); A61B 3/152 (2013.01); G01B 9/02017 (2013.01); G01B 9/02028 (2013.01); G01B 9/02061 (2013.01); G01B 9/02087 (2013.01);
Abstract

Various systems and methods for sequential angle illumination to achieve ultra-high resolution optical coherence tomography (OCT) images. One example OCT system includes a light source, a beam divider, sample arm optics, a detector, and a processor. The light source generates a light beam to illuminate the sample. The beam divider separates the light beam into reference and sample arms. The sample arm optics sequentially illuminates a location in the sample with the light beam from different angles. The detector receives light returned from the reference arm and the sample illuminated at each angle and generates signals. The processor combines the signals to generate an image, which has a transverse resolution that is higher than the transverse resolution achieved from the signal generated from a single angle.


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