The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Nov. 19, 2015
Applicant:

Minex Crc Ltd, Kensington, Western Australia, AU;

Inventors:

David Charles Lawie, Woodlands, AU;

Anthony Malcolm Stevens, Mullaloo, AU;

Frederick Allan Blaine, Doubleview, AU;

Michelle Carey, Mount Lawley, AU;

Aaron Baensch, Woy Woy Bay, AU;

Yulia Uvarova, Munster, AU;

James Stuart Cleverley, Glen Forrest, AU;

Phillipe Sarrazin, Sunnivale, CA (US);

Assignee:

MINEX CRC LTD, Kensington, Western Australia, AU;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
E21B 49/00 (2006.01); E21B 47/09 (2012.01);
U.S. Cl.
CPC ...
E21B 49/005 (2013.01); E21B 47/09 (2013.01);
Abstract

A sampling and analysis system, and related method, for use in exploration drilling, particularly diamond drilling. The system includes a number of sub-systems, including a capturing sub-system, a sample recovery and splitting sub-system, a sample preparation/drying sub-system, a sample handling and sensor sub-system, a data collection and management sub-system, an automated data analysis and interpretation sub-system, and a control sub-system for data collection and process control. The sample handling and sensor sub-system may comprise an integrated arrangement or separate units providing a sample handling sub-system and a sample sensor sub-system. The sample preparation/drying sub-system is operable to ensure that the samples it receives from the sample recovery sub-system are optimally prepared for introduction to the sample handling and sensor sub-system. The sampling and analysis system may be autonomous or operable manually or semi-automatically.


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