The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Oct. 14, 2016
Applicant:

Lonza Limited, Visp, CH;

Inventors:

Rex Polley, Exeter, NH (US);

Matthew Sarcopski, Atlanta, GA (US);

Robert Horton, Lee, NH (US);

Thomas Ellis, Stratham, NH (US);

Paul Pease, Durham, NH (US);

John Chapin, Portsmouth, NH (US);

Assignee:

Lonza Ltd., Visp, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/36 (2006.01); C12Q 3/00 (2006.01); G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
C12M 41/48 (2013.01); C12Q 3/00 (2013.01); G01N 30/8651 (2013.01); G01N 30/8662 (2013.01);
Abstract

The disclosure is directed to a system and method for control of at least one bioreactor, other cell cultivation-related equipment, and systems containing any combination of these in a plant. For example, a Plant-Wide Control System (PWCS) or a Process Control System (PCS) may be divided into three main components: hardware (including operating systems, such as a controller communicating with one or more servers of a network associated with the PWCS, (2) software (such as a control module) for performing control, and (3) one or more instrument control loops, which may be used by the software to maintain certain process values. Moreover, a Height Equivalent of a Theoretical Plate (HETP) value and an asymmetry factor may be determined based on real-time analysis on a chromatography column, using PWCS components.


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