The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Sep. 07, 2018
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

John Eric Tkaczyk, Niskayuna, NY (US);

Feng Pan, Niskayuna, NY (US);

Jiajun Gu, ShangHai, CN;

Zirong Zhai, ShangHai, CN;

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5294 (2013.01);
Abstract

A radiography system for imaging an object, comprises a radiation source located in a first side of the object for generating a plurality of beams; a detector located in a second side of the object for detecting the plurality of beams from the radiation source. The radiography system comprises a first sensor located in the first side of the object for obtaining an object related information and a second sensor disposed on the detector for obtaining a detector-position related information. The radiography system further comprises a controller configured to reconstruct a 3D scene based on the object related information obtained by the first sensor and the detector-position related information obtained by the second sensor and control an operation of at least one of the radiation source and the detector based on the reconstructed 3D scene. A method of controlling the radiography system is also disclosed.


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