The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Aug. 21, 2018
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Jun-taek Lee, Hwaseong-si, KR;
Yun-jeong Kim, Seoul, KR;
Sun-yong Park, Seoul, KR;
Goon-suk Jang, Suwon-si, KR;
Jeong-seob Hong, Hwaseong-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/374 (2011.01); H01L 25/16 (2006.01); H01L 27/146 (2006.01); H04N 5/341 (2011.01); H04N 5/369 (2011.01);
U.S. Cl.
CPC ...
H04N 5/374 (2013.01); H01L 25/167 (2013.01); H01L 27/14605 (2013.01); H01L 27/14607 (2013.01); H01L 27/14623 (2013.01); H01L 27/14643 (2013.01); H04N 5/341 (2013.01); H04N 5/3696 (2013.01); H01L 27/14621 (2013.01); H01L 27/14627 (2013.01);
Abstract
An image sensor, imaging device, and method are provided. The image sensor includes a pixel array including an active area in which plural active pixels are located, and a dummy area in which plural dummy pixels are located, and a test element group (TEG) which is located in the dummy area and on which a test light-shielding pattern, different from a light-shielding pattern formed on the active area, is formed to detect a degree of misalignment between the light-shielding pattern and the active area.