The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Apr. 18, 2018
SK Hynix Inc., Icheon-si, Gyeonggi-do, KR;
Jong Ho Jung, Icheon-si, KR;
SK hynix Inc., Icheon-si, Gyeonggi-do, KR;
Abstract
A test apparatus may be provided. The test apparatus may include a delay compensator configured to generate delayed read data by delaying read data according to a difference between an external turnaround delay value provided externally from the test apparatus and a turnaround delay detection value detected within the test apparatus. The test apparatus may include a determination circuit configured to perform a test result determination operation by comparing the delayed read data with reference data. The turnaround delay detection value may be generated by detecting a time of from a point of time when write data including a read command as the reference data is output to a point of time when the read data is received.