The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Nov. 09, 2016
Applicant:

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Pan Xu, Beijing, CN;

Guangcai Yuan, Beijing, CN;

Yongqian Li, Beijing, CN;

Dongxu Han, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G09G 3/3225 (2016.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 3/3225 (2013.01); G09G 2310/08 (2013.01); G09G 2330/02 (2013.01); G09G 2330/10 (2013.01);
Abstract

A test method of a display panel and a test device are disclosed. The test method includes outputting a data signal of a preset test image to the display panel to cause plural light emitting elements to emit light according to the preset test image; outputting a starting signal to a scan circuit in the display panel to cause the scan circuit to output an active level of a switching circuit to the plural rows of first scan lines as connected, successively, according to a preset timing sequence; receiving a sensing signal from a sensor circuit, including voltage value information of a first terminal of every light emitting element; comparing the voltage value information of the first terminal of every light emitting element with the preset test image to obtain a test result. The test method solves the problem of missing detection of Mura.


Find Patent Forward Citations

Loading…