The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Sep. 19, 2017
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Minoru Nakamura, Yamanashi, JP;

Atsushi Watanabe, Yamanashi, JP;

Yuuki Takahashi, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/11 (2017.01); G06T 7/77 (2017.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06K 9/6212 (2013.01); G06T 7/11 (2017.01); G06T 7/77 (2017.01); G06T 2200/04 (2013.01); G06T 2200/08 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30196 (2013.01); G06T 2207/30232 (2013.01);
Abstract

A three-dimensional data generation apparatus using measurement data from a three-dimensional sensor. The apparatus includes a measured coordinates obtaining section for obtaining measured coordinates of an object in a three-axis rectangular coordinate system set in an observation area, based on measurement data from a three-dimensional sensor measuring the observation area; and a subdivision information preparing section for defining a reference plane parallel to an X-Y plane of the three-axis rectangular coordinate system in the observation area, uniformly divide the reference plane into a plurality of subdivisions, and assign to a subdivision, among the subdivisions, that contains X-Y coordinate values of the measured coordinates of the object, a Z value of the same measured coordinates as a representative height of the subdivision. Three-dimensional data of the observation area is generated by using a position and dimensions in the reference plane and the representative height, of each of the subdivisions.


Find Patent Forward Citations

Nakamura, Minoru. (2020). Apparatus and method of generating three-dimensional data, and monitoring system including three-dimensional data generation apparatus (U.S. Patent No. 10565727). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10565727

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