The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Apr. 29, 2016
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Pingkun Yan, Gaithersburg, MD (US);

Christopher Stephen Hall, Kirkland, WA (US);

Kongkuo Lu, Briarcliff Manor, NY (US);

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 7/136 (2017.01); G06T 7/143 (2017.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 7/0012 (2013.01); G06T 7/136 (2017.01); G06T 7/143 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/30004 (2013.01);
Abstract

The following relates generally to image segmentation. In one aspect, an image is received and preprocessed. The image may then be classified as segmentable if it is ready for segmentation; if not, it may be classified as not segmentable. Multiple, parallel segmentation processes may be performed on the image. The result of each segmentation process may be marked as a potential success (PS) or a potential failure (PF). The results of the individual segmentation processes may be evaluated in stages. An overall failure may be declared if a percentage of the segmentation processes marked as PF reaches a predetermined threshold.


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