The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Oct. 28, 2018
Applicant:

Graftek Imaging Inc., Austin, TX (US);

Inventors:

Romik Chatterjee, Austin, TX (US);

Eric Heinen, Austin, TX (US);

Robert Eastlund, Austin, TX (US);

Assignee:

Graftek Imaging Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); H04N 1/60 (2006.01); G06T 7/90 (2017.01); H05B 33/08 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/90 (2017.01); H04N 1/6033 (2013.01); H04N 1/6086 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30164 (2013.01); H05B 33/0872 (2013.01);
Abstract

A machine includes an enclosure having a double layer wall including an outer wall that provides mechanical protection and protection from dust, fluids and environmental factors and an inner wall having a gradient change in reflectance with height within the enclosure; a lens coupled to the enclosure, the lens defining an optic axis-within the enclosure parallel to the gradient change in reflectance with height; a camera coupled to the lens; an image processing circuit coupled to the camera; and a plurality of light sources coupled to the enclosure, the plurality of light sources defining a plurality of illuminant axes located substantially symmetrically around and parallel to the optic-axis. Each of the plurality of light sources includes a plurality of independently controllable segments located along the illuminant axes so an angle of illumination from the plurality of light sources to the optic axis can be controlled.


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