The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Oct. 26, 2017
Kawasaki Jukogyo Kabushiki Kaisha, Kobe-shi, Hyogo, JP;
Kenji Kasahara, Gifu, JP;
Shuhei Segawa, Aisai, JP;
Osamu Ohji, Kako-gun, JP;
Yuuki Hanawa, Akashi, JP;
Shogo Kojima, Kobe, JP;
KAWASAKI JUKOGYO KABUSHIKI KAISHA, Kobe, JP;
Abstract
A circular scratch inspection apparatus includes: a camera capturing an image of a workpiece surface around a hole; illumination device emitting light to the workpiece surface around the hole, the light being reflected on the workpiece surface is not directly incident on the camera; and image processor. The image processor: generates a second-derivative image by performing secondary differentiation on luminance values in an actual image obtained by the camera; generates a second-derivative curve for each of a plurality of ruler lines, extending radially from the hole center and are set in an inspection target region on the workpiece surface; counts a first reference number of times for each ruler line; calculates a first reference total number of times; and determines presence or absence of a circular scratch by using the first reference total number of times.