The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

May. 26, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Urvesh Bhowan, Bray, IE;

Keith Cortis, Rabat, MT;

Seamus R. McAteer, Navan, IE;

Daniel J. McCloskey, Dublin, IE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/9024 (2019.01);
Abstract

A system, method and computer program product provides improved performance in machine learning, decision making and similar processes. In one example method, a plurality of individual subsets of features of a dataset comprising multiple features are received. The subsets may be provided by applying one or more feature selection methods to the dataset. Each subset is represented as a graph based on a predefined graph template. The example method merges the graphs of the plurality of individual subsets by overlaying the graphs on each other to form a merged feature graph. The merged feature graph may be used for identifying a single subset of features for use in machine learning, decision making and similar processes.


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