The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

May. 23, 2016
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Janardan Misra, Bangalore, IN;

Shubhashis Sengupta, Bangalore, IN;

Sanjay Podder, Thane, IN;

Karthik Acharyulu, Madanapalle, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01); G06F 17/00 (2019.01); G06F 17/30 (2006.01); G06F 17/21 (2006.01); G06F 3/048 (2013.01); G06N 99/00 (2019.01); G06F 19/00 (2018.01); G06N 20/00 (2019.01); G06F 16/23 (2019.01); G06F 16/31 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/23 (2019.01); G06F 16/313 (2019.01);
Abstract

A device may receive a first command, included in a set of commands, to set a configuration parameter associated with performing feature extraction. The device may receive a second command, included in the set of commands, to set a corresponding value for the configuration parameter. The configuration parameter and the corresponding value may correspond to a particular feature metric that is to be extracted. The device may configure, based on the configuration parameter and the corresponding value, feature extraction for a corpus of documents. The device may perform, based on configuring feature extraction for the corpus, feature extraction on the corpus to determine the particular feature metric. The device may generate a feature vector based on performing the feature extraction. The feature vector may include the particular feature metric. The feature vector may include a feature identifier identifying the particular feature metric. The device may provide the feature vector.


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