The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Sep. 01, 2017
Applicant:

Netapp Inc., Sunnyvale, CA (US);

Inventors:

Damarugendra Mallaiah, Bangalore, IN;

Jayanta Basak, Bangalore, IN;

Assignee:

NetApp Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/174 (2019.01); G06F 16/23 (2019.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 16/1748 (2019.01); G06F 3/067 (2013.01); G06F 3/0608 (2013.01); G06F 3/0641 (2013.01); G06F 16/2358 (2019.01);
Abstract

Methods and apparatuses for performing selective deduplication in a storage system are introduced herein. Techniques are provided for determining a first deduplication priority for a first data object based upon a first projected likelihood that deduplication of the first data object will provide a storage space benefit to reduce storage consumption of a storage device. Inline deduplication is performed for the first data object based upon the first deduplication priority exceeding a deduplication probability threshold that is indicative of inline deduplication of the first data object having a threshold likelihood of achieving the storage space benefit from inline deduplication.


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