The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Jun. 11, 2013
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Chao Yuan, Plainsboro, NJ (US);

Amit Chakraborty, East Windsor, NJ (US);

Holger Hackstein, Dietzenbach, DE;

Leif Wiebking, Karlsruhe, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3089 (2013.01); G06F 17/18 (2013.01);
Abstract

A method for monitoring a condition of a system or process includes acquiring sensor data from a plurality of sensors disposed within the system (Sand S). The acquired sensor data is streamed in real-time to a computer system (Sand S). A discriminative framework is applied to the streaming sensor data using the computer system (Sand S). The discriminative framework provides a probability value representing a probability that the sensor data is indicative of an anomaly within the system. The discriminative framework is an integration of a Kalman filter with a logistical function (S).


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