The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Jan. 04, 2019
Hp Printing Korea Co., Ltd., Suwon-si, KR;
HP PRINTING KOREA CO., LTD., Suwon-si, KR;
Abstract
Provided is a method of detecting release of a development nip of an image forming apparatus that includes a photoconductor and a developing roller to contact each other to form a development nip and to be away from each other to release the development nip. The method includes obtaining a reference load, after charging the photoconductor in a state in which the development nip is formed, by measuring a load of a transfer system including the photoconductor and a transfer roller, release the development nip and blocking light irradiated from an exposing unit to the photoconductor, obtaining a detected load by measuring a load of the transfer system after exposing the photoconductor, and determining whether the development nip is normally released based on the reference load and the detected load.