The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Sep. 21, 2018
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Mikio Watanabe, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 7/36 (2006.01); G03B 13/36 (2006.01); G03B 17/00 (2006.01); H04N 5/232 (2006.01); G03B 15/00 (2006.01);
U.S. Cl.
CPC ...
G02B 7/36 (2013.01); G03B 13/36 (2013.01); G03B 17/00 (2013.01); H04N 5/23212 (2013.01); G03B 15/006 (2013.01);
Abstract

An imaging apparatus includes: a distance measurement unit that measures distance values of a plurality of points in a first area which has a focus point as a reference point; a statistical unit that calculates statistics indicating a variation in the measured distance values of the plurality of points in the first area; a size determination unit that determines the size of a second area which has the focus point as a reference point, on the basis of the calculated statistics; a contrast evaluation value calculation unit that calculates a contrast evaluation value on the basis of an image of the second area; and a focusing unit that moves a focus lens to a lens position determined on the basis of the calculated contrast evaluation value.


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