The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Oct. 13, 2016
Applicant:

Schweitzer Engineering Laboratories, Inc., Pullman, WA (US);

Inventors:

David E. Whitehead, Pullman, WA (US);

Tony J. Lee, Pullman, WA (US);

Zachary King Sheffield, Pullman, WA (US);

Tracey G. Windley, Moscow, ID (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 31/11 (2006.01); G01R 31/327 (2006.01); G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
G01R 35/00 (2013.01); G01R 31/086 (2013.01); G01R 31/11 (2013.01); G01R 31/3272 (2013.01);
Abstract

A testing apparatus for imposing a traveling wave signal on an electric system signal for testing a fault detector is disclosed herein. The fault detector may be configured to simulate a fault at a particular location by controlling the timing of the traveling wave signal. The testing apparatus may be configured to impose multiple traveling wave signals to test the accuracy of the fault location determined by the fault detector. The testing apparatus may be configured to determine the calculation accuracy of the fault detector. The testing apparatus may impose a traveling wave signal on a signal simulating an electrical signal on an electric power delivery system. The testing apparatus may be used to test capabilities of a fault detector of detecting a fault using traveling waves or incremental quantities.


Find Patent Forward Citations

Loading…