The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Apr. 24, 2015
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Miho Nagasawa, Hino, JP;
Kenji Suzuki, Hino, JP;
Yoshihiro Tomoda, Hino, JP;
Masanori Ozaki, Hino, JP;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); G01R 33/56 (2006.01); A61B 5/00 (2006.01); A61M 5/00 (2006.01); G01R 33/567 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5601 (2013.01); A61B 5/004 (2013.01); A61B 5/055 (2013.01); A61B 5/4244 (2013.01); A61M 5/007 (2013.01); G01R 33/5673 (2013.01);
Abstract
An MR apparatus creating a timeline suitable for data acquisition in several temporal phases. The MR apparatus including a method for creating a timeline TLhaving a scan time of TSbased on a reference timeline TLhaving a scan time of TS. The method setting start points in time of scans SC, SCand SCin the timeline TLto the same points in time as those in the reference timeline TL, respectively. The method also setting the start point in time of the scan SCin the timeline TLto a sum of the scan time TSand a delay time TDwith respect to the scan SCin the timeline TL