The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Feb. 27, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Tam N. Huynh, White Plains, NY (US);

Keith A. Jenkins, Sleepy Hollow, NY (US);

Franco Stellari, Waldwick, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/12 (2006.01); G01R 31/14 (2006.01); G01R 31/30 (2006.01); H03K 3/03 (2006.01);
U.S. Cl.
CPC ...
G01R 31/129 (2013.01); H03K 3/0315 (2013.01);
Abstract

A method and system of monitoring a reliability of a semiconductor circuit are provided. A current consumption of a first ring oscillator that is in static state is measured at predetermined intervals. Each measured current consumption value is stored. A baseline current consumption value of the first ring oscillator is determined based on the stored current consumption values. A latest measured current consumption value of the first ring oscillator is compared to the baseline current consumption value. Upon determining that the latest measured current consumption value is above a threshold deviation from the baseline current consumption value, the first ring oscillator is identified to have a dielectric breakdown degradation.


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