The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Mar. 24, 2017
Applicant:
Rosemount Aerospace Inc., Burnsville, MN (US);
Inventors:
Magdi A. Essawy, Lakeville, MN (US);
Ben Ping-Tao Fok, Rosemount, MN (US);
Assignee:
Rosemount Aerospace Inc., Burnsville, MN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01K 13/02 (2006.01); G01P 13/02 (2006.01); G01K 15/00 (2006.01); G01P 21/02 (2006.01); G01P 5/165 (2006.01); H05B 3/56 (2006.01); H05B 3/48 (2006.01); B64D 15/12 (2006.01); B64D 47/02 (2006.01); G01J 5/02 (2006.01); G01N 27/02 (2006.01); G01N 27/20 (2006.01); G01N 27/24 (2006.01); G01R 19/32 (2006.01); H05B 3/44 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/008 (2013.01); B64D 15/12 (2013.01); B64D 47/02 (2013.01); G01J 5/025 (2013.01); G01K 13/028 (2013.01); G01K 15/007 (2013.01); G01N 27/026 (2013.01); G01N 27/20 (2013.01); G01N 27/24 (2013.01); G01P 5/165 (2013.01); G01P 13/025 (2013.01); G01P 21/025 (2013.01); G01R 19/32 (2013.01); H05B 3/44 (2013.01); H05B 3/48 (2013.01); H05B 3/56 (2013.01); G01J 2005/0077 (2013.01); H05B 2214/02 (2013.01);
Abstract
A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe system. An operational voltage is provided to the resistive heating element to provide heating for the probe system. The control circuit is configured to provide the operational voltage and monitor a capacitance between the resistive heating element and a metallic sheath of the heater over time. The control circuit is further configured to determine a remaining useful life of the probe system based on the capacitance.