The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Apr. 08, 2016
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Yuka Fujito, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
A chromatograph mass spectrometer for performing SIM measurement and/or MRM measurement on a plurality of target components includes: a memoryfor previously storing measurement conditions created for each of the target components, the measurement conditions including an SIM measurement ion or an MRM transition, a measurement execution time period, and an initial dwell time; a measurement time dividerfor dividing an entire measurement time into a plurality of partial time periods having different combinations of measurements executed in the same time period; a time period input receiverfor receiving an input for selecting one of the partial time periods; a sensitivity information input receiverfor receiving an input of sensitivity information relating to the measurement conditions executed in the selected partial time period; a dwell time calculatorfor calculating a changed dwell time by increasing or reducing the initial dwell time according to details of the input of the sensitivity information; and a loop time calculatorfor calculating a loop time from the changed dwell time and outputting the calculated loop time.