The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
May. 23, 2017
Applicants:
Nicolas Badeau, Quebec, CA;
Jason Habermehl, Quebec, CA;
Inventors:
Nicolas Badeau, Quebec, CA;
Jason Habermehl, Quebec, CA;
Assignee:
Olympus Scientific Solutions Americas Inc., Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/22 (2006.01); G01N 29/26 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/24 (2013.01); G01N 29/225 (2013.01); G01N 29/262 (2013.01); G01N 2291/263 (2013.01);
Abstract
Disclosed is an ultrasonic inspection probe assembly comprising a water wedge and a flexible probe array assembly having a flexible acoustic module. The wedge is machined to match a test surface to be inspected and is configured to shape the acoustic module so that the active surface of the acoustic module is parallel to the test surface. Different wedges may be machined to match different test surfaces, but the same flexible probe array assembly may be used for all such surfaces.