The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Sep. 06, 2018
Fujifilm Corporation, Tokyo, JP;
Yoshirou Yamazaki, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a printing result inspection apparatus, a method, and a program capable of determining a printing defect caused by a printing step and a printing paper defect caused by printing paper by reading the printing paper once. A defect determination unit determines whether defected regions extracted from a non-image region are the printing defect or the printing paper defect based on a density change amount and a color, and an image feature amount of a defected region determined as the printing paper defect in the non-image region is stored in paper defect information and is accumulated in a paper defect information storage unit. Next, the defect determination unit determines whether defected regions extracted from image regions are the printing defect or the printing paper defect based on the paper defect information.